Profundo enfoque para inmersión y STED microscopios
El deep focus of high NA objetivos produce a smaller PSF (punto spread function), which is critical for high-resolution microscopy systems. In many other microscope systems, such as immersion microscopes, a coverslip is used to separate the immersion liquid from the sample. This can distorsion the PSF at the focal plane. We demonstrate that the asimétric PSF is further elongated behind the coverslip. In addition, STED (Stimulated Emission Depletion) microscopy, which is widely used with resolutions of tens of nanometers, consumes a toroidal PSF. Following the approach proposed by P.Török and P.R.T Monro, we model the deep focusing of a Gauss-Raggler beam. Demonstrates how to generate a circular PSF.
Profundo Enfoque con Alto NA Inmersión Microscopía
In VirtualLab Fusion, the influence of the coverslip interface on PSF can be directly analyzed. Focal distortion behind the coverslip is demonstrated and analyzed in a fully vectorial fashion.
Enfoque de Gaussiano-Laguerre haces entrada STED microscopio
It was shown that the focusing of high-order Gaussian-Laguerre beams produces a ring-shaped PSF. The size of the annular PSF depends, among other variables, on the particular order of the beam.
